Session 8 - Characterization and test methods for device variability in nanoscale technologies - researchr publication authors

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Hamid Mahmoodi, Jeanne Trinko Mechler. Session 8 - Characterization and test methods for device variability in nanoscale technologies. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. IEEE, 2008. [doi]

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