Session 8 - Characterization and test methods for device variability in nanoscale technologies

Hamid Mahmoodi, Jeanne Trinko Mechler. Session 8 - Characterization and test methods for device variability in nanoscale technologies. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. IEEE, 2008. [doi]

@inproceedings{MahmoodiM08,
  title = {Session 8 - Characterization and test methods for device variability in nanoscale technologies},
  author = {Hamid Mahmoodi and Jeanne Trinko Mechler},
  year = {2008},
  doi = {10.1109/CICC.2008.4672035},
  url = {http://dx.doi.org/10.1109/CICC.2008.4672035},
  researchr = {https://researchr.org/publication/MahmoodiM08},
  cites = {0},
  citedby = {0},
  booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
  publisher = {IEEE},
  isbn = {978-1-4244-2018-6},
}