Hamid Mahmoodi, Jeanne Trinko Mechler. Session 8 - Characterization and test methods for device variability in nanoscale technologies. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. IEEE, 2008. [doi]
@inproceedings{MahmoodiM08, title = {Session 8 - Characterization and test methods for device variability in nanoscale technologies}, author = {Hamid Mahmoodi and Jeanne Trinko Mechler}, year = {2008}, doi = {10.1109/CICC.2008.4672035}, url = {http://dx.doi.org/10.1109/CICC.2008.4672035}, researchr = {https://researchr.org/publication/MahmoodiM08}, cites = {0}, citedby = {0}, booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008}, publisher = {IEEE}, isbn = {978-1-4244-2018-6}, }