Y. Maidon, Yann Deval, Jean-Baptiste Begueret. An Improved CMOS BICS for On-Line Testing. In 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain. pages 100, IEEE Computer Society, 2000. [doi]
@inproceedings{MaidonDB00,
title = {An Improved CMOS BICS for On-Line Testing},
author = {Y. Maidon and Yann Deval and Jean-Baptiste Begueret},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2000/0646/00/06460100abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/MaidonDB00},
cites = {0},
citedby = {0},
pages = {100},
booktitle = {6th IEEE International On-Line Testing Workshop (IOLTW 2000), 3-5 July 2000, Palma de Mallorca, Spain},
publisher = {IEEE Computer Society},
isbn = {0-7695-0646-1},
}