J. Maier, Andreas Steininger. Online test vector insertion: A concurrent built-in self-testing (CBIST) approach for asynchronous logic. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 33-38, IEEE, 2014. [doi]
@inproceedings{MaierS14,
title = {Online test vector insertion: A concurrent built-in self-testing (CBIST) approach for asynchronous logic},
author = {J. Maier and Andreas Steininger},
year = {2014},
doi = {10.1109/DDECS.2014.6868759},
url = {http://dx.doi.org/10.1109/DDECS.2014.6868759},
researchr = {https://researchr.org/publication/MaierS14},
cites = {0},
citedby = {0},
pages = {33-38},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4560-3},
}