Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy - researchr publication authors

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Michael Maiworm, Christian Wagner 0007, Ruslan Temirov, F. Stefan Tautz, Rolf Findeisen. Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy. In 2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018. pages 4360-4366, IEEE, 2018. [doi]

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