Michael Maiworm, Christian Wagner 0007, Ruslan Temirov, F. Stefan Tautz, Rolf Findeisen. Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy. In 2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018. pages 4360-4366, IEEE, 2018. [doi]
@inproceedings{Maiworm0TTF18,
title = {Two-degree-of-freedom control combining machine learning and extremum seeking for fast scanning quantum dot microscopy},
author = {Michael Maiworm and Christian Wagner 0007 and Ruslan Temirov and F. Stefan Tautz and Rolf Findeisen},
year = {2018},
doi = {10.23919/ACC.2018.8431022},
url = {https://doi.org/10.23919/ACC.2018.8431022},
researchr = {https://researchr.org/publication/Maiworm0TTF18},
cites = {0},
citedby = {0},
pages = {4360-4366},
booktitle = {2018 Annual American Control Conference, ACC 2018, Milwaukee, WI, USA, June 27-29, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5428-6},
}