Subhashis Majumder, Michael L. Bushnell, Vishwani D. Agrawal. Path Delay Testing: Variable-Clock Versus Rated-Clock. In 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India. pages 470-475, IEEE Computer Society, 1998. [doi]
@inproceedings{MajumderBA98,
title = {Path Delay Testing: Variable-Clock Versus Rated-Clock},
author = {Subhashis Majumder and Michael L. Bushnell and Vishwani D. Agrawal},
year = {1998},
doi = {10.1109/ICVD.1998.646651},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1998.646651},
tags = {testing},
researchr = {https://researchr.org/publication/MajumderBA98},
cites = {0},
citedby = {0},
pages = {470-475},
booktitle = {11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India},
publisher = {IEEE Computer Society},
}