Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell. A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults. J. Comput. Sci. Technol., 19(6):955-964, 2004. [doi]
@article{MajumderBAB04,
title = {A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults},
author = {Subhashis Majumder and Bhargab B. Bhattacharya and Vishwani D. Agrawal and Michael L. Bushnell},
year = {2004},
url = {http://jcst.ict.ac.cn/conc/conc46.html#paper28},
tags = {classification, testing},
researchr = {https://researchr.org/publication/MajumderBAB04},
cites = {0},
citedby = {0},
journal = {J. Comput. Sci. Technol.},
volume = {19},
number = {6},
pages = {955-964},
}