The following publications are possibly variants of this publication:
- Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault TestsMarwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal. itc 1995: 139-148
- Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault TestsMarwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal. et, 11(1):55-67, 1997. [doi]
- Implementing Symmetric Functions with Hierarchical Modules for Stuck-At and Path-Delay Fault TestabilityHafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. et, 22(2):125-142, 2006. [doi]