T. M. Mak. Limitation of structural scan delay test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 471, IEEE Computer Society, 2005. [doi]
@inproceedings{Mak05:1,
title = {Limitation of structural scan delay test},
author = {T. M. Mak},
year = {2005},
doi = {10.1109/ATS.2005.74},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.74},
tags = {testing},
researchr = {https://researchr.org/publication/Mak05%3A1},
cites = {0},
citedby = {0},
pages = {471},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}