Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki. Characterization of Germanium Nanocrystallites Grown on SiO::2:: by a Conductive AFM Probe Technique. IEICE Transactions, 88-C(4):705-708, 2005. [doi]
@article{MakiharaOMHM05,
title = {Characterization of Germanium Nanocrystallites Grown on SiO::2:: by a Conductive AFM Probe Technique},
author = {Katsunori Makihara and Yoshihiro Okamoto and Hideki Murakami and Seiichiro Higashi and Seiichi Miyazaki},
year = {2005},
doi = {10.1093/ietele/e88-c.4.705},
url = {http://dx.doi.org/10.1093/ietele/e88-c.4.705},
researchr = {https://researchr.org/publication/MakiharaOMHM05},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {88-C},
number = {4},
pages = {705-708},
}