Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield - researchr publication authors

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Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda. Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. IET Circuits, Devices & Systems, 6(4):260-270, 2012. [doi]

This author has not been identified. Look up 'Hiroshi Makino' in GoogleThis author has not been identified. Look up 'Shunji Nakata' in GoogleThis author has not been identified. Look up 'Hirotsugu Suzuki' in GoogleThis author has not been identified. Look up 'Shin'ichiro Mutoh' in GoogleThis author has not been identified. Look up 'Masayuki Miyama' in GoogleThis author has not been identified. Look up 'Tsutomu Yoshimura' in GoogleThis author has not been identified. Look up 'Shuhei Iwade' in GoogleThis author has not been identified. Look up 'Yoshio Matsuda' in Google

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