Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda. Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. IET Circuits, Devices & Systems, 6(4):260-270, 2012. [doi]
Abstract is missing.