Hiroshi Makino, Shunji Nakata, Hirotsugu Suzuki, Shin'ichiro Mutoh, Masayuki Miyama, Tsutomu Yoshimura, Shuhei Iwade, Yoshio Matsuda. Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield. IET Circuits, Devices & Systems, 6(4):260-270, 2012. [doi]
@article{MakinoNSMMYIM12,
title = {Utilising the normal distribution of the write noise margin to easily predict the SRAM write yield},
author = {Hiroshi Makino and Shunji Nakata and Hirotsugu Suzuki and Shin'ichiro Mutoh and Masayuki Miyama and Tsutomu Yoshimura and Shuhei Iwade and Yoshio Matsuda},
year = {2012},
doi = {10.1049/iet-cds.2012.0090},
url = {http://dx.doi.org/10.1049/iet-cds.2012.0090},
researchr = {https://researchr.org/publication/MakinoNSMMYIM12},
cites = {0},
citedby = {0},
journal = {IET Circuits, Devices & Systems},
volume = {6},
number = {4},
pages = {260-270},
}