Designing Testable Control Paths with Multiple and Feedback Scan-Paths

Rafic Z. Makki, C. Tiansheng. Designing Testable Control Paths with Multiple and Feedback Scan-Paths. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 484-492, IEEE Computer Society, 1986.

Authors

Rafic Z. Makki

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C. Tiansheng

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