Rafic Z. Makki, C. Tiansheng. Designing Testable Control Paths with Multiple and Feedback Scan-Paths. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 484-492, IEEE Computer Society, 1986.
@inproceedings{MakkiT86,
title = {Designing Testable Control Paths with Multiple and Feedback Scan-Paths},
author = {Rafic Z. Makki and C. Tiansheng},
year = {1986},
tags = {testing, C++},
researchr = {https://researchr.org/publication/MakkiT86},
cites = {0},
citedby = {0},
pages = {484-492},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}