Y. Makris, J. Collins, A. Orailoglu, P. Vishakantaiah. Transparency-based hierarchical test generation for modular RTL designs. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 689-692, IEEE, 2000. [doi]
@inproceedings{MakrisCOV00,
title = {Transparency-based hierarchical test generation for modular RTL designs},
author = {Y. Makris and J. Collins and A. Orailoglu and P. Vishakantaiah},
year = {2000},
doi = {10.1109/ISCAS.2000.856422},
url = {https://doi.org/10.1109/ISCAS.2000.856422},
researchr = {https://researchr.org/publication/MakrisCOV00},
cites = {0},
citedby = {0},
pages = {689-692},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings},
publisher = {IEEE},
}