Y. Makris, J. Collins, A. Orailoglu, P. Vishakantaiah. Transparency-based hierarchical test generation for modular RTL designs. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 689-692, IEEE, 2000. [doi]
Abstract is missing.