Special session on machine learning: How will machine learning transform test? - researchr publication

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Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner. Special session on machine learning: How will machine learning transform test?. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]

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