Yiorgos Makris, Alex Orailoglu, Praveen Vishakantaiah. Modular test generation and concurrent transparency-based test translation using gate-level ATPG. In Proceedings of the IEEE 2000 Custom Integrated Circuits Conference, CICC 2000, Orlando, FL, USA, May 21-24, 2000. pages 75-78, IEEE, 2000. [doi]
Abstract is missing.