Testing for Timing Faults in Synchronous Sequential Integrated Circuits

Yashwant K. Malaiya, Ramesh Narayanaswamy. Testing for Timing Faults in Synchronous Sequential Integrated Circuits. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 560-573, IEEE Computer Society, 1983.

Authors

Yashwant K. Malaiya

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Ramesh Narayanaswamy

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