Yashwant K. Malaiya, Ramesh Narayanaswamy. Testing for Timing Faults in Synchronous Sequential Integrated Circuits. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 560-573, IEEE Computer Society, 1983.
@inproceedings{MalaiyaN83,
title = {Testing for Timing Faults in Synchronous Sequential Integrated Circuits},
author = {Yashwant K. Malaiya and Ramesh Narayanaswamy},
year = {1983},
tags = {testing},
researchr = {https://researchr.org/publication/MalaiyaN83},
cites = {0},
citedby = {0},
pages = {560-573},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}