Modeling and Testing for Timing Faults in Synchronous Sequential Circuits

Yashwant K. Malaiya, Ramesh Narayanaswamy. Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Design & Test of Computers, 1(4):62-74, 1984. [doi]

@article{MalaiyaN84,
  title = {Modeling and Testing for Timing Faults in Synchronous Sequential Circuits},
  author = {Yashwant K. Malaiya and Ramesh Narayanaswamy},
  year = {1984},
  doi = {10.1109/MDT.1984.5005692},
  url = {https://doi.org/10.1109/MDT.1984.5005692},
  researchr = {https://researchr.org/publication/MalaiyaN84},
  cites = {0},
  citedby = {0},
  journal = {IEEE Design & Test of Computers},
  volume = {1},
  number = {4},
  pages = {62-74},
}