Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner. Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. In 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009. pages 67-72, IEEE Computer Society, 2009. [doi]
@inproceedings{MalandruccoloCFR09,
title = {Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications},
author = {Vezio Malandruccolo and Mauro Ciappa and Wolfgang Fichtner and Hubert Rothleitner},
year = {2009},
doi = {10.1109/ETS.2009.18},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.18},
tags = {testing},
researchr = {https://researchr.org/publication/MalandruccoloCFR09},
cites = {0},
citedby = {0},
pages = {67-72},
booktitle = {14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3703-0},
}