N. Malbert, Nathalie Labat, A. Curutchet, C. Sury, V. Hoel, J.-C. De Jaeger, N. Defrance, Y. Douvry, Christian Dua, Mourad Oualli, C. Bru-Chevallier, J. M. Bluet, W. Chikhaoui. Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. Microelectronics Reliability, 49(9-11):1216-1221, 2009. [doi]
Abstract is missing.