Mutation Based Feature Localization

Jan Malburg, Emmanuelle Encrenaz-Tiphène, Görschwin Fey. Mutation Based Feature Localization. In 15th International Microprocessor Test and Verification Workshop, MTV 2014, Austin, TX, USA, December 15-16, 2014. pages 49-54, IEEE, 2014. [doi]

Authors

Jan Malburg

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Emmanuelle Encrenaz-Tiphène

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Görschwin Fey

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