Jan Malburg, Emmanuelle Encrenaz-Tiphène, Görschwin Fey. Mutation Based Feature Localization. In 15th International Microprocessor Test and Verification Workshop, MTV 2014, Austin, TX, USA, December 15-16, 2014. pages 49-54, IEEE, 2014. [doi]
@inproceedings{MalburgEF14,
title = {Mutation Based Feature Localization},
author = {Jan Malburg and Emmanuelle Encrenaz-Tiphène and Görschwin Fey},
year = {2014},
doi = {10.1109/MTV.2014.14},
url = {http://dx.doi.org/10.1109/MTV.2014.14},
researchr = {https://researchr.org/publication/MalburgEF14},
cites = {0},
citedby = {0},
pages = {49-54},
booktitle = {15th International Microprocessor Test and Verification Workshop, MTV 2014, Austin, TX, USA, December 15-16, 2014},
publisher = {IEEE},
isbn = {978-1-4673-6858-2},
}