Jan Malburg, Alexander Finder, Görschwin Fey. Automated feature localization for hardware designs using coverage metrics. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 941-946, ACM, 2012. [doi]
Abstract is missing.