Elaheh Malekzadeh, Nezam Rohbani, Zhonghai Lu, Masoumeh Ebrahimi. The Impact of Faults on DNNs: A Case Study. In Luigi Dilillo, Luca Cassano, Athanasios Papadimitriou, editors, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2021, Athens, Greece, October 6-8, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.