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Deriving Feature Fail Rate from Silicon Volume Diagnostics Data

Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide. Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Design & Test of Computers, 30(4):26-34, 2013. [doi]

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Shobhit Malik

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Thomas Herrmann

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Sriram Madhavan

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Rao Desineni

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Chris Schuermyer

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Geir Eide

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