Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide. Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Design & Test of Computers, 30(4):26-34, 2013. [doi]
@article{MalikHMDSE13,
title = {Deriving Feature Fail Rate from Silicon Volume Diagnostics Data},
author = {Shobhit Malik and Thomas Herrmann and Sriram Madhavan and Rao Desineni and Chris Schuermyer and Geir Eide},
year = {2013},
doi = {10.1109/MDAT.2013.2273791},
url = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2273791},
researchr = {https://researchr.org/publication/MalikHMDSE13},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {4},
pages = {26-34},
}