Sivanarayana Mallela, Shianling Wu. A Sequential Circuit Test Generation System. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 57-61, IEEE Computer Society, 1985.
@inproceedings{MallelaW85,
title = {A Sequential Circuit Test Generation System},
author = {Sivanarayana Mallela and Shianling Wu},
year = {1985},
tags = {testing},
researchr = {https://researchr.org/publication/MallelaW85},
cites = {0},
citedby = {0},
pages = {57-61},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}