An IDDQ BIST approach to characterize phase-locked loop parameters

Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala. An IDDQ BIST approach to characterize phase-locked loop parameters. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

@inproceedings{MaltabasEKMM13,
  title = {An IDDQ BIST approach to characterize phase-locked loop parameters},
  author = {Samed Maltabas and Osman Kubilay Ekekon and Kemal Kulovic and Anne Meixner and Martin Margala},
  year = {2013},
  doi = {10.1109/VTS.2013.6548911},
  url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548911},
  researchr = {https://researchr.org/publication/MaltabasEKMM13},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-5542-1},
}