Samed Maltabas, Osman Kubilay Ekekon, Kemal Kulovic, Anne Meixner, Martin Margala. An IDDQ BIST approach to characterize phase-locked loop parameters. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]
Abstract is missing.