Eman El Mandouh, A. Gamal, A. Khaled, T. Ibrahim, Amr G. Wassal, Elsayed Hemayed. Construction of coverage data for post-silicon validation using big data techniques. In 24th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2017, Batumi, Georgia, December 5-8, 2017. pages 46-49, IEEE, 2017. [doi]
Abstract is missing.