Eman El Mandouh, Ashraf Salem, Mennatallah Amer, Amr G. Wassal. Cross-product functional coverage analysis using machine learning clustering techniques. In 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, DTIS 2018, Taormina, Italy, April 9-12, 2018. pages 1-2, IEEE, 2018. [doi]
Abstract is missing.