Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi 0001, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa. Innovative Practices Track: Innovative Analog Circuit Testing Technologies. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1, IEEE, 2022. [doi]
@inproceedings{MangelsdorfMMBI22,
title = {Innovative Practices Track: Innovative Analog Circuit Testing Technologies},
author = {Chris Mangelsdorf and Manasa Madhvaraj and Salvador Mir and Manuel Barragán and Daisuke Iimori and Takayuki Nakatani and Shogo Katayama and Gaku Ogihara and Yujie Zhao and Jianglin Wei and Anna Kuwana and Kentaroh Katoh and Kazumi Hatayama and Haruo Kobayashi 0001 and Keno Sato and Takashi Ishida 0003 and Toshiyuki Okamoto and Tamotsu Ichikawa},
year = {2022},
doi = {10.1109/VTS52500.2021.9794191},
url = {https://doi.org/10.1109/VTS52500.2021.9794191},
researchr = {https://researchr.org/publication/MangelsdorfMMBI22},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}