Chris Mangelsdorf, Manasa Madhvaraj, Salvador Mir, Manuel Barragán, Daisuke Iimori, Takayuki Nakatani, Shogo Katayama, Gaku Ogihara, Yujie Zhao, Jianglin Wei, Anna Kuwana, Kentaroh Katoh, Kazumi Hatayama, Haruo Kobayashi 0001, Keno Sato, Takashi Ishida 0003, Toshiyuki Okamoto, Tamotsu Ichikawa. Innovative Practices Track: Innovative Analog Circuit Testing Technologies. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1, IEEE, 2022. [doi]
Abstract is missing.