Murari Mani, Michael Orshansky. A New Statistical Optimization Algorithm for Gate Sizing. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 272-277, IEEE Computer Society, 2004. [doi]
@inproceedings{ManiO04,
title = {A New Statistical Optimization Algorithm for Gate Sizing},
author = {Murari Mani and Michael Orshansky},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/iccd/2004/2231/00/22310272abs.htm},
tags = {optimization},
researchr = {https://researchr.org/publication/ManiO04},
cites = {0},
citedby = {0},
pages = {272-277},
booktitle = {22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2231-9},
}