Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, R. Rodriguez, Joan Figueras. On the selection of efficient arithmetic additive test pattern generators [logic test]. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 9-14, IEEE Computer Society, 2003. [doi]
@inproceedings{ManichGBLRRF03,
title = {On the selection of efficient arithmetic additive test pattern generators [logic test]},
author = {Salvador Manich and L. García and Luz Balado and Emili Lupon and Josep Rius and R. Rodriguez and Joan Figueras},
year = {2003},
doi = {10.1109/ETW.2003.1231662},
url = {https://doi.org/10.1109/ETW.2003.1231662},
researchr = {https://researchr.org/publication/ManichGBLRRF03},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003},
publisher = {IEEE Computer Society},
isbn = {0-7695-1908-3},
}