Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, R. Rodriguez, Joan Figueras. On the selection of efficient arithmetic additive test pattern generators [logic test]. In 8th European Test Workshop, ETW 2003, Maastricht, The Netherlands, May 25-28, 2003. pages 9-14, IEEE Computer Society, 2003. [doi]
Abstract is missing.