Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources

Salvador Manich, L. Garcia-Deiros, Joan Figueras. Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(11):2046-2058, 2007. [doi]

Authors

Salvador Manich

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L. Garcia-Deiros

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Joan Figueras

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