An on-die all-digital delay measurement circuit with 250fs accuracy

Mozhgan Mansuri, Bryan Casper, Frank O'Mahony. An on-die all-digital delay measurement circuit with 250fs accuracy. In Symposium on VLSI Circuits, VLSIC 2012, Honolulu, HI, USA, June 13-15, 2012. pages 98-99, IEEE, 2012. [doi]

Authors

Mozhgan Mansuri

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Bryan Casper

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Frank O'Mahony

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