An on-die all-digital delay measurement circuit with 250fs accuracy

Mozhgan Mansuri, Bryan Casper, Frank O'Mahony. An on-die all-digital delay measurement circuit with 250fs accuracy. In Symposium on VLSI Circuits, VLSIC 2012, Honolulu, HI, USA, June 13-15, 2012. pages 98-99, IEEE, 2012. [doi]

Abstract

Abstract is missing.