Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss

Haiyu Mao, Xian Zhang, Guangyu Sun, Jiwu Shu. Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1623-1626, IEEE, 2017. [doi]

Authors

Haiyu Mao

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Xian Zhang

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Guangyu Sun

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Jiwu Shu

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