Haiyu Mao, Xian Zhang, Guangyu Sun, Jiwu Shu. Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1623-1626, IEEE, 2017. [doi]
@inproceedings{MaoZSS17,
title = {Protect non-volatile memory from wear-out attack based on timing difference of row buffer hit/miss},
author = {Haiyu Mao and Xian Zhang and Guangyu Sun and Jiwu Shu},
year = {2017},
doi = {10.23919/DATE.2017.7927251},
url = {https://doi.org/10.23919/DATE.2017.7927251},
researchr = {https://researchr.org/publication/MaoZSS17},
cites = {0},
citedby = {0},
pages = {1623-1626},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}