Paul Marchal, Bruno Bougard, Guruprasad Katti, Michele Stucchi, Wim Dehaene, Antonis Papanikolaou, Diederik Verkest, Bart Swinnen, Eric Beyne. 3-D Technology Assessment: Path-Finding the Technology/Design Sweet-Spot. Proceedings of the IEEE, 97(1):96-107, 2009. [doi]
Abstract is missing.