The impact of functional safety standards in the design and test of reliable and available integrated circuits

Riccardo Mariani. The impact of functional safety standards in the design and test of reliable and available integrated circuits. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.