Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters. A structured and scalable mechanism for test access to embedded reusable cores. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 284-293, IEEE Computer Society, 1998. [doi]
Abstract is missing.