Erik Jan Marinissen, Ferenc Fodor, Arnita Podpod, Michele Stucchi, Yu-Rong Jian, Cheng-Wen Wu. Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits. In IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018. pages 1-10, IEEE, 2018. [doi]
@inproceedings{MarinissenFPSJW18, title = {Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits}, author = {Erik Jan Marinissen and Ferenc Fodor and Arnita Podpod and Michele Stucchi and Yu-Rong Jian and Cheng-Wen Wu}, year = {2018}, doi = {10.1109/TEST.2018.8624731}, url = {https://doi.org/10.1109/TEST.2018.8624731}, researchr = {https://researchr.org/publication/MarinissenFPSJW18}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {IEEE International Test Conference, ITC 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, publisher = {IEEE}, isbn = {978-1-5386-8382-8}, }